Avalanching in Single-Event-Upset Charge Collection in Semiconductor Diodes
نویسندگان
چکیده
منابع مشابه
Single Event Upset (SEU) in SRAM
Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecraft electronics. Transient effects on circuits and systems from high energetic particles can interrupt electronics operation or crash the systems. This phenomenon is particularly serious in complementary metal-oxide-semiconductor (CMOS) integrated circuits (ICs) since most of modern ICs are implem...
متن کاملSingle Event Upset at Ground Level
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.
متن کاملUltrafast long-range charge separation in organic semiconductor photovoltaic diodes.
Understanding the charge-separation mechanism in organic photovoltaic cells (OPVs) could facilitate optimization of their overall efficiency. Here we report the time dependence of the separation of photogenerated electron hole pairs across the donor-acceptor heterojunction in OPV model systems. By tracking the modulation of the optical absorption due to the electric field generated between the ...
متن کاملSingle Event Mirroring and DRAM Sense Amplifier Designs for Improved Single-Event- Upset Performance
This paper proposes and investigates schemes for hardening the conventional CMOS cross-coupled DRAM sense amplifier to single event upset (SEU). These schemes, adapted from existing SRAM hardening techniques, are intended to harden the dynamic random access memory to bitline-mode errors during the sensing period. Simulation results indicate that a 9kΩ L-resistor hardening scheme provides greate...
متن کاملSingle Event Upset Mitigation Techniques for SRAM-based FPGAs
This paper discusses high level techniques for designing fault tolerant systems in SRAM-based FPGAs, without modification in the FPGA architecture. TMR has been successfully applied in FPGAs to mitigate transient faults, which are likely to occur in space applications. However, TMR comes with high area and power dissipation penalties. The new technique proposed in this paper was specifically de...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 1986
ISSN: 0018-9499
DOI: 10.1109/tns.1986.4334640